SWIR InGaAs FPA enables photon emission failure analysis

Xenics has developed a short-wavelength infrared (SWIR) indium gallium arsenide (InGaAs) detector, the XFPA-1.7-640-LN2, to meet requirements for low dark current, low noise, and sensitivity. The circuitry is based on a source-follower detector (SFD) read-out, which provides high sensitivity at a resolution of 640 × 512 pixels and a pixel pitch of 20 μm. The frame rate is 2.5 Hz, which can be increased when a smaller region of interest is selected. Nondestructive read-out mode simplifies operation when long integration times are used. The sensor device offers two distinct modes of operation, NDR (nondestructive readout) and ITR (integrate then read). NDR mode operation starts with a simultaneous global reset of the entire array. In ITR mode, all pixels start integration at the same time and then are sequentially read out. The sensor device has four different outputs, which can drive capacitive loads. The sensor allows operation in a window-of-interest (WOI) mode.