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Full-field optical measurement for material parameter identification with inverse methods

  • J. Gu
  • , S. Cooreman
  • , A. Smits
  • , S. Bossuyt
  • , H. Sol
  • , David Lecompte
  • , J. Vantomme
  • VUB University

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/CongresprocedureConferentiebijdragepeer review

32 Citaten (Scopus)

Samenvatting

The application of FE simulation in manufacturing processes and virtual prototyping increases every day. In order to allow accurate simulations, correct constitutive models are needed as input to the FE software. A modern and promising way to identify the material parameters in those constitutive models is "inverse modeling". Full-field measurement is a suitable way to get the necessary experimental data. The technique has many advantages such as large information contents, non-contacting measurement, and versatile size of observation region, among others. However, there is no standardization yet for this kind of measurements. Therefore, there are many disagreements among researchers about how to design DICT experiments and how to correctly collect the data from DICT experiments. This paper will concentrate on discussing the key points of those problems as well as presenting some work experience with the DICT.

Originele taal-2Engels
TitelHigh Performance Structures and Materials III
Pagina's239-248
Aantal pagina's10
DOI's
StatusGepubliceerd - 2006
Evenement3rd International Conference on High Performance Structures and Materials 2006, HPSM06 - Ostend, België
Duur: 3 mei 20065 mei 2006

Publicatie series

NaamWIT Transactions on the Built Environment
Volume85
ISSN van geprinte versie1743-3509

Congres

Congres3rd International Conference on High Performance Structures and Materials 2006, HPSM06
Land/RegioBelgië
StadOstend
Periode3/05/065/05/06

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