Samenvatting
A new scheme for detecting edges and lines in multi-channel SAR images is proposed. The line detector is constructed from the edge detector. The latter is based on multi-variate statistical hypothesis tests applied to log-intensity SAR images. The raw results are vectorized by a traditional bright line extraction process. The scheme is illustrated by extracting dark linear structures on various full-polarimetric SAR images.
Originele taal-2 | Engels |
---|---|
Pagina's (van-tot) | 921-923 |
Aantal pagina's | 3 |
Tijdschrift | Proceedings - International Conference on Pattern Recognition |
Volume | 16 |
Nummer van het tijdschrift | 2 |
Status | Gepubliceerd - 2002 |