TY - GEN
T1 - Compressed sensing mm-wave SAR for non-destructive testing applications using side information
AU - Becquaert, Mathias
AU - Cristofani, Edison
AU - Pandey, Gokarna
AU - Vandewal, Marijke
AU - Stiens, Johan
AU - Deligiannis, Nikos
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/6/3
Y1 - 2016/6/3
N2 - This paper evaluates the applicability of an innovative strategy for applying Compressed Sensing (CS) on Synthetic Aperture Radar (SAR) imaging, in the mm-wave range, using prior or structural side information. The studied technique adds the side information to the conventional CS minimization problem using an l1-l1 minimization approach, allowing for lower sub-Nyquist sampling than standard CS predicts. The applicability of this strategy on ultra-wideband SAR measurements is tested through simulations and real Non-Destructive Testing (NDT) experiments on a 3D-printed polymer object.
AB - This paper evaluates the applicability of an innovative strategy for applying Compressed Sensing (CS) on Synthetic Aperture Radar (SAR) imaging, in the mm-wave range, using prior or structural side information. The studied technique adds the side information to the conventional CS minimization problem using an l1-l1 minimization approach, allowing for lower sub-Nyquist sampling than standard CS predicts. The applicability of this strategy on ultra-wideband SAR measurements is tested through simulations and real Non-Destructive Testing (NDT) experiments on a 3D-printed polymer object.
KW - Compressed sensing (CS)
KW - Non-Destructive Testing (NDT)
KW - Synthetic Aperture Radar (SAR)
UR - http://www.scopus.com/inward/record.url?scp=84978290978&partnerID=8YFLogxK
U2 - 10.1109/RADAR.2016.7485244
DO - 10.1109/RADAR.2016.7485244
M3 - Conference contribution
AN - SCOPUS:84978290978
T3 - 2016 IEEE Radar Conference, RadarConf 2016
BT - 2016 IEEE Radar Conference, RadarConf 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE Radar Conference, RadarConf 2016
Y2 - 2 May 2016 through 6 May 2016
ER -