A cryogenic ADC operating down to 4.2K

Ybe Cretan; Patrick Merken; Willy Sansen; Robert Mertens; Chris Van Hoof

doi:10.1109/ISSCC.2007.373497

A cryogenic ADC operating down to 4.2K

Ybe Cretan, Patrick Merken, Willy Sansen, Robert Mertens, Chris Van Hoof

Communication, Information, Systems and Sensors

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › peer review

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A SAR ADC is designed to operate from room temperature down to 4.2K, as needed by cryogenic sensor systems. The ADC is robust to cryogenic temperature-induced transistor anomalies. It has an INL of -0.8(0.5)LSB and DNL of 1.1 (0.4)LSB at 4.2K(300K). It draws 70μA for a 200pF output capacitor at 3kHz sampling rate and 5V supply.

Originele taal-2	Engels
Titel	2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers
Uitgeverij	Institute of Electrical and Electronics Engineers Inc.
Pagina's	468-470
Aantal pagina's	3
ISBN van geprinte versie	1424408539, 9781424408535
DOI's	https://doi.org/10.1109/ISSCC.2007.373497
Status	Gepubliceerd - 2007
Evenement	54th IEEE International Solid-State Circuits Conference, ISSCC 2007 - San Francisco, CA, Verenigde Staten van Amerika Duur: 11 feb. 2007 → 15 feb. 2007

Publicatie series

Naam	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
ISSN van geprinte versie	0193-6530

Congres

Congres	54th IEEE International Solid-State Circuits Conference, ISSCC 2007
Land/Regio	Verenigde Staten van Amerika
Stad	San Francisco, CA
Periode	11/02/07 → 15/02/07

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10.1109/ISSCC.2007.373497

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Cretan, Y., Merken, P., Sansen, W., Mertens, R., & Van Hoof, C. (2007). A cryogenic ADC operating down to 4.2K. In 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers (blz. 468-470). Artikel 4242468 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2007.373497

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title = "A cryogenic ADC operating down to 4.2K",

abstract = "A SAR ADC is designed to operate from room temperature down to 4.2K, as needed by cryogenic sensor systems. The ADC is robust to cryogenic temperature-induced transistor anomalies. It has an INL of -0.8(0.5)LSB and DNL of 1.1 (0.4)LSB at 4.2K(300K). It draws 70μA for a 200pF output capacitor at 3kHz sampling rate and 5V supply.",

author = "Ybe Cretan and Patrick Merken and Willy Sansen and Robert Mertens and {Van Hoof}, Chris",

year = "2007",

doi = "10.1109/ISSCC.2007.373497",

language = "English",

isbn = "1424408539",

series = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "468--470",

booktitle = "2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers",

note = "54th IEEE International Solid-State Circuits Conference, ISSCC 2007 ; Conference date: 11-02-2007 Through 15-02-2007",

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Cretan, Y, Merken, P, Sansen, W, Mertens, R & Van Hoof, C 2007, A cryogenic ADC operating down to 4.2K. in 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers., 4242468, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Institute of Electrical and Electronics Engineers Inc., blz. 468-470, 54th IEEE International Solid-State Circuits Conference, ISSCC 2007, San Francisco, CA, Verenigde Staten van Amerika, 11/02/07. https://doi.org/10.1109/ISSCC.2007.373497

A cryogenic ADC operating down to 4.2K. / Cretan, Ybe; Merken, Patrick; Sansen, Willy et al.
2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., 2007. blz. 468-470 4242468 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

Onderzoeksoutput: Hoofdstuk in Boek/Rapport/Congresprocedure › Conferentiebijdrage › peer review

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AB - A SAR ADC is designed to operate from room temperature down to 4.2K, as needed by cryogenic sensor systems. The ADC is robust to cryogenic temperature-induced transistor anomalies. It has an INL of -0.8(0.5)LSB and DNL of 1.1 (0.4)LSB at 4.2K(300K). It draws 70μA for a 200pF output capacitor at 3kHz sampling rate and 5V supply.

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Cretan Y, Merken P, Sansen W, Mertens R, Van Hoof C. A cryogenic ADC operating down to 4.2K. In 2007 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc. 2007. blz. 468-470. 4242468. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). doi: 10.1109/ISSCC.2007.373497

A cryogenic ADC operating down to 4.2K

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