Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology
- Anna Brook
- , Edison Cristofani
- , Mathias Becquaert
- , Ben Lauwens
- , Joachim Jonuscheit
- , Marijke Vandewal
- Fraunhofer Institute for Physical Measurement Techniques IPM
Résultats de recherche: Contribution à un journal › Article › Revue par des pairs
6
Citations
(Scopus)