Détails des équipements
Description
The Materials Laboratory performs materials failure investigations for Defense, federal institutions (Federal police, Justice department) or third parties.
The Materials Lab is equipped with state-of-the-art laboratory instruments for determining the static and dynamic mechanical behavior of materials: 50, 100 and 300 kN tensile testing machines, with high-resolution cameras for digital image correlation (DIC), macro and microelectronic hardness testers, a torsion machine up to 5 kNm, a fatigue testing machine, a Charpy pendulum impact tester, Hopkinson compression bars for dynamic testing, with a robot for high and low temperature testing.
For materials characterization and failure analysis, the laboratory is equipped with metallographic preparation tools, a spark-excitation OES spectrometer, several optical microscopes, a digital optical microscope with a motorized stage and a laser-induced plasma atomic emission spectrometry (LIBS) capability; and an environmental scanning electron microscope (SEM) equipped with an EDX spectrometer and an electron backscatter diffraction (EBSD) device.
The Materials Lab is equipped with state-of-the-art laboratory instruments for determining the static and dynamic mechanical behavior of materials: 50, 100 and 300 kN tensile testing machines, with high-resolution cameras for digital image correlation (DIC), macro and microelectronic hardness testers, a torsion machine up to 5 kNm, a fatigue testing machine, a Charpy pendulum impact tester, Hopkinson compression bars for dynamic testing, with a robot for high and low temperature testing.
For materials characterization and failure analysis, the laboratory is equipped with metallographic preparation tools, a spark-excitation OES spectrometer, several optical microscopes, a digital optical microscope with a motorized stage and a laser-induced plasma atomic emission spectrometry (LIBS) capability; and an environmental scanning electron microscope (SEM) equipped with an EDX spectrometer and an electron backscatter diffraction (EBSD) device.
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