Spectrum Sensing Method Basedon the Likelihood Ratio Goodness of Fit Test under Noise Uncertainty

D Teguig, B Scheers, Vincent Le Nir, F Horlin

Research output: Contribution to journalArticlepeer-review

Original languageUndefined/Unknown
Pages (from-to)488-494
Number of pages7
JournalInternational Journal of of Engineering Research Technology (IJERT)
Volume3
Issue number9
Publication statusPublished - 2014

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