Full-field optical measurement for material parameter identification with inverse methods

J. Gu, S. Cooreman, A. Smits, S. Bossuyt, H. Sol, David Lecompte, J. Vantomme

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The application of FE simulation in manufacturing processes and virtual prototyping increases every day. In order to allow accurate simulations, correct constitutive models are needed as input to the FE software. A modern and promising way to identify the material parameters in those constitutive models is "inverse modeling". Full-field measurement is a suitable way to get the necessary experimental data. The technique has many advantages such as large information contents, non-contacting measurement, and versatile size of observation region, among others. However, there is no standardization yet for this kind of measurements. Therefore, there are many disagreements among researchers about how to design DICT experiments and how to correctly collect the data from DICT experiments. This paper will concentrate on discussing the key points of those problems as well as presenting some work experience with the DICT.

Original languageEnglish
Title of host publicationHigh Performance Structures and Materials III
Pages239-248
Number of pages10
DOIs
Publication statusPublished - 2006
Event3rd International Conference on High Performance Structures and Materials 2006, HPSM06 - Ostend, Belgium
Duration: 3 May 20065 May 2006

Publication series

NameWIT Transactions on the Built Environment
Volume85
ISSN (Print)1743-3509

Conference

Conference3rd International Conference on High Performance Structures and Materials 2006, HPSM06
Country/TerritoryBelgium
CityOstend
Period3/05/065/05/06

Keywords

  • Digital image correlation
  • FEA
  • Full field measurement
  • Inverse method

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