Full-field optical measurement for material parameter identification with inverse methods

Jun Gu, Steven Cooreman, Arwen Smits, Sven Bossuyt, Hugo Sol, David Lecompte, John Vantomme

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In recent decade, the applications of FE simulation in manufacturing process increase dramatically because of the rapid development of Information Technology (IT). In order to do the simulation accurately and computation efficiency, the good developed constitutive models are needed to implement to FE program. All those constitutive models contain a set of material parameters, which need to be identified by so called "inverse method". As an important input part in the identification of material parameters, such full-field measurement by means of digital image correlation technique (DITC), it exploits a good prospect for inverse method since it has the advantages, for instance non-contacting, big observation region and so on. However, there is no standardization for such kind of measurements. Therefore, there are many disputations about how to design DIC experiment and how to correctly collect the data from DIC experiment. This paper will concentrate on discussing the key points of those problems as well as presenting the work experience of using DICT.

Original languageEnglish
Title of host publicationProceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Pages1289-1299
Number of pages11
Publication statusPublished - 2006
EventSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006 - Saint Louis, MO, United States
Duration: 4 Jun 20067 Jun 2006

Publication series

NameProceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Volume3

Conference

ConferenceSEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Country/TerritoryUnited States
CitySaint Louis, MO
Period4/06/067/06/06

Keywords

  • Digital image correlation
  • FEA
  • Full field measurement
  • Inverse method

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