Compressed sensing and defect-based dictionaries for characteristics extraction in mm-Wave non-destructive testing

Edison Cristofani, Mathias Becquaert, Gokarna Pandey, Marijke Vandewal, Nikos Deligiannis, Johan Stiens

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In ultra-wideband non-destructive testing of large multilayered polymers, data collection and reduction can be achieved by applying compressed sensing techniques. In this work, using effective modelling of possible defects, such as air gaps between layers, we construct defect dictionaries and use them as support data for a signal similarity-based classifier, which will automatically extract the main characteristics of the inspected defect.

Original languageEnglish
Title of host publication41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467384858
DOIs
Publication statusPublished - 28 Nov 2016
Event41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 - Copenhagen, Denmark
Duration: 25 Sept 201630 Sept 2016

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume2016-November
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Country/TerritoryDenmark
CityCopenhagen
Period25/09/1630/09/16

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