@inproceedings{b34353d60fe04a25b296b7fd87fb8d87,
title = "Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET",
author = "S. Jachmich and T. Eich and G. Arnoux and W. Fundamenski",
year = "2009",
language = "English",
isbn = "9781622763368",
series = "36th EPS Conference on Plasma Physics 2009, EPS 2009 - Europhysics Conference Abstracts",
pages = "769--772",
booktitle = "36th EPS Conference on Plasma Physics 2009, EPS 2009 - Europhysics Conference Abstracts",
note = "36th European Physical Society Conference on Plasma Physics 2009, EPS 2009 ; Conference date: 29-06-2009 Through 03-07-2009",
}