Charged particle-induced gamma excitation as a possible diagnostic technique for escaping MeV ions on ITER

G. Bonheure; G. Van Wassenhove

doi:10.1063/1.1538363

Charged particle-induced gamma excitation as a possible diagnostic technique for escaping MeV ions on ITER

G. Bonheure, G. Van Wassenhove

Laboratory for Plasma Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Activation methods were examined to measure escaping alpha particles on ITER. A target inside the collector was activated by escaping MeV alpha particles. Test experiments were under preparation and simulations with Monte Carlo MCNP4C code were used to assess the performance of the detectors.

Original language	English
Pages (from-to)	1726-1729
Number of pages	4
Journal	Review of Scientific Instruments
Volume	74
Issue number	3
DOIs	https://doi.org/10.1063/1.1538363
Publication status	Published - Mar 2003

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title = "Charged particle-induced gamma excitation as a possible diagnostic technique for escaping MeV ions on ITER",

abstract = "Activation methods were examined to measure escaping alpha particles on ITER. A target inside the collector was activated by escaping MeV alpha particles. Test experiments were under preparation and simulations with Monte Carlo MCNP4C code were used to assess the performance of the detectors.",

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year = "2003",

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Charged particle-induced gamma excitation as a possible diagnostic technique for escaping MeV ions on ITER

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