A 400 KHz line rate 2048-pixel stitched SWIR linear array

Ankur Anchlia, Rosa M. Vinella, Daphne Gielen, Kristof Wouters, Vincent Vervenne, Peter Hooylaerts, Pieter Deroo, Wouter Ruythooren, Danny De Gaspari, Jo Das, Patrick Merken

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Xenics has developed a family of stitched SWIR long linear arrays that operate up to 400 KHz of line rate. These arrays serve medical and industrial applications that require high line rates as well as space applications that require long linear arrays. The arrays are based on a modular ROIC design concept: modules of 512 pixels are stitched during fabrication to achieve 512, 1024 and 2048 pixel arrays. Each 512-pixel module has its own on-chip digital sequencer, analog readout chain and 4 output buffers. This modular concept enables a long array to run at a high line rates irrespective of the array length, which limits the line rate in a traditional linear array. The ROIC is flip-chipped with InGaAs detector arrays. The FPA has a pixel pitch of 12.5μm and has two pixel flavors: square (12.5μm) and rectangular (250μm). The frontend circuit is based on Capacitive Trans-impedance Amplifier (CTIA) to attain stable detector bias, and good linearity and signal integrity, especially at high speeds. The CTIA has an input auto-zero mechanism that allows to have low detector bias (<20mV). An on-chip Correlated Double Sample (CDS) facilitates removal of CTIA KTC and 1/f noise, and other offsets, achieving low noise performance. There are five gain modes in the FPA giving the full well range from 85Ke-to 40Me-. The measured input referred noise is 35e-rms in the highest gain mode. The FPA operates in Integrate While Read mode and, at a master clock rate of 60MHz and a minimum integration time of 1.4μs, achieves the highest line rate of 400 KHz. In this paper, design details and measurements results are presented in order to demonstrate the array performance.

Original languageEnglish
Title of host publicationInfrared Technology and Applications XLII
EditorsPaul R. Norton, Charles M. Hanson, Gabor F. Fulop, Bjorn F. Andresen
PublisherSociety of Photo-Optical Instrumentation Engineers
ISBN (Electronic)9781510600607
DOIs
Publication statusPublished - 2016
EventInfrared Technology and Applications XLII - Baltimore, United States
Duration: 18 Apr 201621 Apr 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9819
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInfrared Technology and Applications XLII
Country/TerritoryUnited States
CityBaltimore
Period18/04/1621/04/16

Keywords

  • Auto-zero
  • CDS
  • CTIA
  • High Line rate
  • InGaAs
  • Line Scan
  • Linear Array
  • Machine vision
  • SWIR
  • Space
  • Spectral Domain Optical-Coherence Tomography

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