@inproceedings{07369491c4ac43bea43c8a76c313f8de,
title = "A 400 KHz line rate 2048-pixel stitched SWIR linear array",
abstract = "Xenics has developed a family of stitched SWIR long linear arrays that operate up to 400 KHz of line rate. These arrays serve medical and industrial applications that require high line rates as well as space applications that require long linear arrays. The arrays are based on a modular ROIC design concept: modules of 512 pixels are stitched during fabrication to achieve 512, 1024 and 2048 pixel arrays. Each 512-pixel module has its own on-chip digital sequencer, analog readout chain and 4 output buffers. This modular concept enables a long array to run at a high line rates irrespective of the array length, which limits the line rate in a traditional linear array. The ROIC is flip-chipped with InGaAs detector arrays. The FPA has a pixel pitch of 12.5μm and has two pixel flavors: square (12.5μm) and rectangular (250μm). The frontend circuit is based on Capacitive Trans-impedance Amplifier (CTIA) to attain stable detector bias, and good linearity and signal integrity, especially at high speeds. The CTIA has an input auto-zero mechanism that allows to have low detector bias (<20mV). An on-chip Correlated Double Sample (CDS) facilitates removal of CTIA KTC and 1/f noise, and other offsets, achieving low noise performance. There are five gain modes in the FPA giving the full well range from 85Ke-to 40Me-. The measured input referred noise is 35e-rms in the highest gain mode. The FPA operates in Integrate While Read mode and, at a master clock rate of 60MHz and a minimum integration time of 1.4μs, achieves the highest line rate of 400 KHz. In this paper, design details and measurements results are presented in order to demonstrate the array performance.",
keywords = "Auto-zero, CDS, CTIA, High Line rate, InGaAs, Line Scan, Linear Array, Machine vision, SWIR, Space, Spectral Domain Optical-Coherence Tomography",
author = "Ankur Anchlia and Vinella, {Rosa M.} and Daphne Gielen and Kristof Wouters and Vincent Vervenne and Peter Hooylaerts and Pieter Deroo and Wouter Ruythooren and {De Gaspari}, Danny and Jo Das and Patrick Merken",
note = "Publisher Copyright: {\textcopyright} 2016 SPIE.; Infrared Technology and Applications XLII ; Conference date: 18-04-2016 Through 21-04-2016",
year = "2016",
doi = "10.1117/12.2223696",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Society of Photo-Optical Instrumentation Engineers",
editor = "Norton, {Paul R.} and Hanson, {Charles M.} and Fulop, {Gabor F.} and Andresen, {Bjorn F.}",
booktitle = "Infrared Technology and Applications XLII",
}