Skip to main navigation Skip to search Skip to main content

Characterization of a microwave reflectometer for edge density profile measurements at the ICRH antenna on Wendelstein 7-X

Activity: Talk or presentationScientific poster presentation

Period7 Apr 202510 Apr 2025
Event title6th European Conference on Plasma Diagnostics (ECPD)
Event typeConference
LocationPrague, Czech RepublicShow on map
Degree of RecognitionInternational