Abstract
A 320 × 256 element hybrid infrared array is presented which consists of In0.78Ga0.22As photodiodes grown by molecular beam epitaxy on a GaAs substrate. The interconnection yield of the hybrid indium-bump process is above 97%. Electro-optical sensor characteristics are discussed.
Originalsprache | Englisch |
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Seiten (von - bis) | 588-590 |
Seitenumfang | 3 |
Fachzeitschrift | Electronics Letters |
Jahrgang | 38 |
Ausgabenummer | 12 |
DOIs | |
Publikationsstatus | Veröffentlicht - 6 Juni 2002 |