TY - GEN
T1 - Compressed sensing and defect-based dictionaries for characteristics extraction in mm-Wave non-destructive testing
AU - Cristofani, Edison
AU - Becquaert, Mathias
AU - Pandey, Gokarna
AU - Vandewal, Marijke
AU - Deligiannis, Nikos
AU - Stiens, Johan
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/11/28
Y1 - 2016/11/28
N2 - In ultra-wideband non-destructive testing of large multilayered polymers, data collection and reduction can be achieved by applying compressed sensing techniques. In this work, using effective modelling of possible defects, such as air gaps between layers, we construct defect dictionaries and use them as support data for a signal similarity-based classifier, which will automatically extract the main characteristics of the inspected defect.
AB - In ultra-wideband non-destructive testing of large multilayered polymers, data collection and reduction can be achieved by applying compressed sensing techniques. In this work, using effective modelling of possible defects, such as air gaps between layers, we construct defect dictionaries and use them as support data for a signal similarity-based classifier, which will automatically extract the main characteristics of the inspected defect.
UR - http://www.scopus.com/inward/record.url?scp=85006105228&partnerID=8YFLogxK
U2 - 10.1109/IRMMW-THz.2016.7758678
DO - 10.1109/IRMMW-THz.2016.7758678
M3 - Conference contribution
AN - SCOPUS:85006105228
T3 - International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
BT - 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Y2 - 25 September 2016 through 30 September 2016
ER -