Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology

Anna Brook, Edison Cristofani, Mathias Becquaert, Ben Lauwens, Joachim Jonuscheit, Marijke Vandewal

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

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Engineering