TY - GEN
T1 - An 8-bit Flash Analog-to-Digital Converter in standard CMOS technology functional in ultra wide temperature range from 4.2 K to 300 K
AU - Creten, Y.
AU - Merken, P.
AU - Mertens, R.
AU - Sansen, W.
AU - Van Hoof, C.
PY - 2008
Y1 - 2008
N2 - This paper presents the first standard CMOS Flash Analog-to-Digital Converter (ADC) operational over an Ultra Wide Temperature range (UWT) from room temperature (27° C or 300 K) down to 4 K (-269° C). To preserve the circuits performance over the UWT range in the presence of temperature induced transistor anomalies, dedicated architecture and switching schemes are employed.
AB - This paper presents the first standard CMOS Flash Analog-to-Digital Converter (ADC) operational over an Ultra Wide Temperature range (UWT) from room temperature (27° C or 300 K) down to 4 K (-269° C). To preserve the circuits performance over the UWT range in the presence of temperature induced transistor anomalies, dedicated architecture and switching schemes are employed.
UR - https://www.scopus.com/pages/publications/58049109369
U2 - 10.1109/ESSCIRC.2008.4681845
DO - 10.1109/ESSCIRC.2008.4681845
M3 - Conference contribution
AN - SCOPUS:58049109369
SN - 9781424423620
T3 - ESSCIRC 2008 - Proceedings of the 34th European Solid-State Circuits Conference
SP - 274
EP - 277
BT - ESSCIRC 2008 - Proceedings of the 34th European Solid-State Circuits Conference
T2 - 34th European Solid-State Circuits Conference, ESSCIRC 2008
Y2 - 15 September 2008 through 19 September 2008
ER -